IoT test in focus at SEMICON Japan in Tokyo
A wide range of test solutions for diverse applications throughout the Internet of Things (IoT)will be featured by Advantest at this year’s SEMICON Japan (December 14-16) in Tokyo. Advantest will showcase both its newest test solutions and its market-proven products. Displays will be organised into four general categories of IoT applications: Industrial, Wireless/Wearables, Connected Homes, and Connected Automobiles.
Featured products and services will include industry-leading test and measurement platforms, performance-enhancing modules and channel cards, e-beam metrology and lithography tools, test handlers, downloadable test programs, burn-in test systems, probe cards and field-services.
Technical insight will be provided through live and virtual-reality demonstrations as well as digital graphics, allowing visitors to learn all about the latest IC test innovations offered by Advantest worldwide.
“We are committed to providing our customers with solutions for measuring the connected world and everything in it,” said Judy Davies, vice president of Global Marketing Communications at Advantest. “Our exhibit at this year’s SEMICON Japan tradeshow embodies that commitment in ways that will be both informative and entertaining for new and continuing customers alike.”
On December 15, Shin Kimura, vice president of Advantest’s ASD Test and Measurement Business Group, will present a paper on “IoT Society and Test Technology” during the half-day Autonomous & Connected Car Forum.
Featured products
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Analog Devices Inc.
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MAX22516
Analog Devices Inc.
IO-Link Data Link Controller with Transceiver and Integrated DC-DC
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