Events News

Flying probe offers a wide range of solutions

28th April 2015
Jordan Mulcare
0

This year, representing Israel, Seica will be present in the Spider Engineering Booth at NewTech Exhibition, where it will be showing the Pilot4D V8 flying probe and the ATE/instrument MINI 80/200 system. The company has also announced the twentieth anniversary of its first flying probe tester sale.

The Pilot4D flying probe line is one of the most versatile and complete line of automatic flying probers, offering a wide range of solutions and performances. The Pilot family includes systems with from four or eight test probes, able to access simultaneously one or both sides of the board, which can be positioned either horizontally or vertically.

During the show, visitors will have the opportunity to see the Pilot4DV8 with system options and performances, which make the probe ready for the latest technological challenges covering all types of electrical, optical and thermal validations. Seica flying probes are able to test on the smallest SMD chip, such as the 03015 metric, and are suitable for prototyping, production, repair and reverse engineering of electronic boards including LED light testing applications.

In most manufacturing environments, the requirement of size reduction, portability and integration now also involves Automated Test Systems (ATE). For this reason, Seica has created the MINI Line, a small-sized ATE with great potential in the different operational environments, combined with a very competitive price/performance ratio. The solution is designed, like the in-circuit and functional compact line systems, based on the thirty-year experience of design and implementation of electrical test solutions.

In case of more expandable solutions requests, Seica can propose the compact line systems, which are characterised by the research for optimisation of the test costs and the particular attention to the space reduction (footprint and overall dimensions), times (for test) and waste in general.

Featured products

Upcoming Events

View all events
Newsletter
Latest global electronics news
© Copyright 2024 Electronic Specifier