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electronica 2016: Test applications to the fore in Munich

6th October 2016
Mick Elliott
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A wide-range of applications embracing IoT, Power Analysis, Education and Research, Semiconductor Design and RF Test will be showcased by Tektronix at electronica in Munich (November 8-11). Visitors to the Tektronix stand will be able to get hands-on demonstrations and technical advice to help them solve their individual test and measurement challenges.

The TBS2000, a next generation basic oscilloscope will be on parade. It features the longest record length and largest display in its class for faster signal evaluation and troubleshooting. The instrument puts expanded capabilities, including the ability to use a wide range of Tektronix probes, into the hands of budget-constrained design engineers and educators.

The IsoVu Measurement System (pictured) with its revolutionary IsoVu technology uses optical communications and power-over-fibre for complete galvanic isolation. When combined with an oscilloscope equipped with the TekVPI interface, it is the first measurement system capable of accurately resolving high bandwidth, differential signals, in the presence of large common mode voltage. 

A 3-in-1 arbitrary waveform generator, the AWG4000 Series, has basic, advanced and digital modes, which means the portable signal generator can be easily shared across design teams and can meet a wide variety of signal generation needs ranging from radar and wireless communications to embedded systems design and research applications.

The RSA500 all in-one field installation and maintenance tool for spectrum analysis is ideal for portable spectrum, vector signal and distance to fault analysis, interference hunting, mapping and network management applications.  

Also featuring is the customisable and fully integrated Keithley 4200A-SCS parameter analyser that accelerates semiconductor device, materials and process insights by reducing characterisation complexity for new or sporadic users, simplifying test setup, and delivering clear, precise results.

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