ECOC display addresses 400G test challenges

“With 100G moving into production and 400G design efforts in full swing, the test challenges around characterisation, verification and debug of both silicon and system designs have never been greater,” said Dean Miles, Market Development Manager, Performance Oscilloscopes, Tektronix EMEA. “As ECOC attendees will be able to see first hand, Tektronix is well positioned to help our customers push the boundaries of higher data rates, emerging standards, and cutting-edge research while reducing time to market with our high-performance solutions.”

Data centre networking technology providers are looking to continuously increase the capacity and precision of high speed data transfers.

Solutions to characterise electrical and optical performance that will be demonstrated by Tektronix include the DSA8300 sampling oscilloscope. It has an 80GHz optical sampling module showing support for IEEE 802.3bs based 400G optical testing for TDECQ, including new advances in high-sensitivity single-mode/multi-mode optical measurements for NRZ and PAM-4 up to 28GBd and the DPO70000SX 70GHz ATI performance oscilloscope that analyses single shot PAM-4 signals with live triggering and post-equalised error detection for 400G standards.

There will be an end-to-end demonstration of optical modulation analysis software supporting multi-OMA systems, featuring the AWG70000 Series Arbitrary Waveform Generator, and the DPO70000SX oscilloscope for applications such as spatial division multiplexing and more.

New announcements will give PAM4 designers the option of using either a sampling or real-time oscilloscope when debugging PAM4 optical systems.

ECOC features more than 300 companies from nearly 80 countries around the world to help the more than 5,000 attendees leverage the latest in optical innovations and meet insatiable consumer and business demand for more bandwidth and increased data centre performance.