Design
Flexible multi-channel AFE for 5G wireless test systems
This high speed multi-channel data capture reference design from Texas Instruments enables optimum system performance. System designers needs to consider critical design parameters like clock jitter and skew for high speed multi-channel clock generation, which affects overall system SNR, SFDR, channel to channel skew and deterministic latency.
This reference design demonstrates multi-channel AFE and clock solution using high speed data converters with JESD204B, high speed amplifiers, high performance clocks and low noise power solutions to achieve optimum system performance.
To learn more, click here.
Featured products
MAX17793
Analog Devices Inc.
3V to 80V, 3A, High-Efficiency, Synchronous Step-Down DC-DC Converter
| SKU: | MAX17793 |
|---|---|
| Stock: | 9316 |
| Cost: | $3.64 |
MAX22516
Analog Devices Inc.
IO-Link Data Link Controller with Transceiver and Integrated DC-DC
| SKU: | MAX22516 |
|---|---|
| Stock: | 8000 |
| Cost: | $5.42 |
Upcoming Events
19th November 2024
Germany MESSE BREMEN Halls 4, 5, 6 & 7 Findorffstrasse 101 28215 Bremen
