Agilent Technologies' Software Fundamentally Improves, Automates STMicroelectronics' Device Modeling On-Wafer Measurements

STMicroelectronics uses IC-CAP as a device modeling platform to extract semiconductor device models for silicon devices (CMOS and BJT, for example). The company will now use IC-CAP WaferPro to conduct all on-wafer automated measurements.

IC-CAP WaferPro allows users to control semiautomatic and fully automatic wafer probe stations and execute DC, CV and RF measurements. It automates spot and swept measurements across a range of temperatures. Wafer realignment is handled automatically at each temperature change, removing the need for engineers to supervise measurements. Test plans can run automatically at different measurement stations, with different hardware, allowing maximum utilization of lab equipment. Built on a sophisticated architecture, WaferPro also enables efficient data analysis and processing and provides a foundation for future advanced modeling tasks, such as statistical analysis and modeling.

Over the past two years, we worked with Agilent's R&D team on ways to extend the IC-CAP platform, our modeling tool of choice, to address our measurement and data flow challenges, said Herv� Jaouen, technology R&D director, modeling and simulation, at STMicroelectronics. We are very impressed with the automation capabilities that IC-CAP WaferPro offers. The ability to collect, post process and organize data, all integrated in the same platform, greatly improves the efficiency of our modeling organization.

We are delighted by STMicroelectronics' decision to adopt IC-CAP WaferPro, a product designed to unify modeling tasks and allow modeling teams to work together more closely, said Mark Pierpoint, vice president and general manager of Agilent EEsof EDA. As the premier measurement company, we are pleased to provide a next-generation software and measurement platform that addresses the new challenges of state-of-the-art device modeling.