Verigy has earned a Five Star Award for the third consecutive year in VLSIresearch's 2011 Customer Satisfaction Survey on Chip-Making Equipment. Verigy is also once again the only SOC and memory test equipment provider among the 14 semiconductor equipment companies to win a Five Star Award this year.

VOICE 2011 Conference, a users group meeting and partners event organized by premier semiconductor test company Verigy (NASDAQ: VRGY), will include a strong technical program with a large number of papers from chip makers on innovative test techniques for a broad range of ICs tested on Verigy systems. The event, to be held April 19-21 in Santa Cruz, Calif., is an international forum for sharing technical content and exchanging perspectives on the...

Verigy (NASDAQ: VRGY), a leading semiconductor test company, has won Semiconductor Equipment and Materials International's (SEMI) first Advanced Testing Innovation Award, created to honor exemplary contributions to improving functionality and efficiency in semiconductor testing. The award was presented in Taipei by Vincent Siew, vice president of Taiwan, Republic of China, to Rwei-Ming Chen, Verigy's Taiwan country manager, at last week's SEMICO...

Touchdown Technologies, a wholly owned subsidiary of leading semiconductor test company Verigy (NASDAQ: VRGY), today introduced its 1Td300 full-wafer probe card, the company's first probe card for single-touchdown, high-volume testing of advanced DRAM memory devices. Touchdown Technologies will demonstrate the new product, capable of highly parallel testing of 300 mm or 200 mm wafers, in Verigy's booth (#5847 in North Hall) at the SEMICON West tr...

Verigy (NASDAQ : VRGY), société leader du test des semi-conducteurs, a étendu la possibilité d'échelonnement de sa plateforme V93000, qui a fait ses preuves en production, en y ajoutant la solution Direct-Probe(TM). Cette capacité de test avec sondes à haute performance pour les CI de communication numérique, à signal mixte et sans fil assure l'un des niveaux les plus élevés d'intégrité de signaux qui existe pour le test d'échanti...

Verigy has extended the scalability of its production-proven V93000 platform by adding the Direct-Probe solution. This high-performance probe test capability for digital, mixed-signal and wireless communication ICs delivers one of the highest signal integrity levels available for production-volume, multi-site probe testing.

Verigy announced that it has shipped its 250th V93000 Port Scale RF test system. This significant milestone highlights the system’s broad market success and rapid customer adoption by integrated device manufacturers (IDMs) as well as fabless semiconductor companies and their outsource assembly and testing (OSAT) partners since its introduction in June 2007. Market-leading companies are using this platform to test a wide variety of RF devices, i...

Verigy has received two awards – in 10 BEST Large Chip Equipment Suppliers and THE BEST Test Equipment categories – from the 2010 Customer Satisfaction Survey conducted by VLSI Research Inc., a leading research and analysis firm covering the semiconductor industry.

Verigy has enhanced its V101 platform by adding new capability for testing mixed-signal semiconductor devices. The versatile V101 platform, designed for high-volume testing of cost-sensitive ICs at both the wafer sort and final test production steps, now delivers mixed-signal capability designed for testing devices with audio and video signals.

Verigy has received its first five star award for exceptional customer satisfaction from market research and analysis firm VLSI Research Inc. Of the 13 companies to receive the award this year, Verigy is the only test equipment manufacturer. This annual award is based on a company’s performance in six categories: cost of ownership, quality of results, product performance, customer service, technical leadership, and commitment.

As the market for fourth-generation (4G) wireless communications continues to emerge, semiconductor test equipment company Verigy has installed its V93000 Port Scale RF tester in production lines for next-generation Long Term Evolution (LTE) broadband data and telephony chips.

Verigy, the semiconductor test company, today introduced SmartRA (Scalable Memory Redundancy Technology), a memory redundancy analysis (RA) option for its V6000 WS test system. SmartRA provides a scalable, flexible, cost-effective solution that allows manufacturers to meet the expanding fail storage and performance requirements of redundancy analysis for DRAM.

Verigy has introduced the V101, a low-cost, zero-footprint, 100 MHz tester-on-board system for wafer sort and final test of today’s most cost-sensitive ICs and microcontrollers. The V101 addresses the extreme low cost requirements of these devices and intense time-to-market pressures.

Verigy, a semiconductor test company, today introduced its Yield Learning Solution, a comprehensive solution that integrates on-tester, real-time capture and statistical analysis of electrical failures on complex SoC die.

Verigy announced today that the automated test equipment users have ranked it the number one test equipment supplier in the VLSI Research Inc 2009 Customer Satisfaction Survey. Verigy ranked first among the world’s 10 BEST Test Equipment suppliers, and was the highest-ranking ATE supplier in the category of Large Suppliers of Chip Making Equipment. This year marks the fourth consecutive year in which Verigy has ranked in the 10 BEST, and al...

Verigy, a semiconductor test company, has announced it has been awarded the 2009 Product Innovation of the Year Award from Frost & Sullivan for its V6000 tester platform. Introduced in late 2008, the V6000 enables testing of both flash and DRAM memory on the same platform, at breakthrough cost-of-test. The V6000 is versatile and scalable across the entire semiconductor memory test process, including engineering, wafer sort and final test.