Nearfield Instruments B.V., a provider of process control metrology solutions for advanced semiconductor devices, has launched ‘Lightning Mode’, a new feature for QUADRA, which is the semiconductor industry’s highest-throughput atomic force microscopy (AFM) metrology system for advanced semiconductor devices.

Nearfield Instruments, a provider of ground-breaking process control metrology solutions for advanced semiconductor devices, has launched AUDIRA – the industry’s first in-line, non-destructive subsurface metrology system for advanced semiconductor manufacturing.

Nearfield Instruments have launched AUDIRA, the industry’s first and only in-line, non-destructive subsurface metrology system for advanced semiconductor manufacturing.