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NI-Emerson

  • Measurement House Newbury Business Park London Road Newbury Berkshire
    RG14 2PS
    United Kingdom
  • 01635 523545
  • http://ni.com/uk

NI-Emerson Articles

Displaying 461 - 480 of 699
Test & Measurement
6th November 2009
National Instruments Introduces Video Test Solution for Multimedia Device Testing

National Instruments today introduced NI VideoMASTER 3.0, a new PXI Express-based digital video analyzer for validation and production test of multimedia devices. VideoMASTER simplifies the testing of multimedia devices by using configurable measurement steps within NI TestStand test management software to automate a full suite of video measurements. By taking advantage of the efficient, configurable performance of VideoMASTER 3.0, multimedia tes...

Analysis
30th October 2009
Extended Temperature NI Single-Board RIO Devices Deliver a More Rugged Solution for Embedded Deployment

National Instruments today announced four new extended operating temperature versions of the NI Single-Board RIO devices, featuring a -40 to 85°C operating temperature range. These boards provide engineers and developers low-cost embedded system development options by combining an onboard reconfigurable field-programmable gate array (FPGA), real-time processor and analog and digital I/O – all on a single-board computer (SBC). The four new NI s...

Analysis
30th October 2009
National Instruments Updates Graphical Software for LEGO MINDSTORMS NXT Robotics Platform

National Instruments today announced a new version of its intuitive drag-and-drop software that powers the LEGO MINDSTORMS NXT 2.0 robotics kits for retail and education. With this system, children as young as 9 years old can design their own robots using new features such as color recognition, Bluetooth support and additional robot models that offer children more options to express their creativity. The software, which will be included with all ...

Analysis
12th October 2009
Andy Green OBE to Deliver Keynote Address at NIDays 09

National Instruments UK & Ireland today announced that Wing Commander Andy Green OBE, British Royal Air Force fighter pilot and the holder of the World Land Speed Record, will deliver the Keynote at NIDays, the UK’s annual professional development conference and exhibition for engineers, scientists and educators involved in test, control and design. Entitled “Adventures in Engineering and Innovation”, Green’s Keynote will discuss his exp...

Test & Measurement
8th October 2009
National Instruments Announces More Than 8000 Drivers Available Through IDNet for Instrument Control

National Instruments has announced more than 8000 instrument drivers available through the NI Instrument Driver Network (IDNet) that make it easy to connect and control stand-alone instruments. IDNet is the industry’s largest source of instrument drivers and easy-to-use software optimised for instrument control, including NI LabVIEW, LabWindowsTM/CVI and Measurement Studio for Microsoft Visual Studio. This network, which includes more than 500 ...

Test & Measurement
6th October 2009
National Instruments - NI CompactDAQ Chassis for Higher-Performance USB Data Acquisition at a Lower Price

National Instruments has announced the NI cDAQ-9174 four-slot and cDAQ-9178 eight-slot NI CompactDAQ chassis, which are advanced versions of the popular NI CompactDAQ chassis released in 2006. The two new chassis build on the functionality of the original chassis by adding a four-slot option; the ability to take mixed-sensor measurements at different rates; two built-in, external BNC triggers; and four advanced counters. These, along with NI-DAQm...

Test & Measurement
30th September 2009
National Instruments - Enhanced Sound and Vibration Software for Noise Frequency Response Analysis

National Instruments has announced the release of the NI Sound and Vibration Measurement Suite 2009, a comprehensive collection of analysis and signal processing tools for noise, vibration and harshness (NVH), machine condition monitoring and audio test applications.

Analysis
24th September 2009
National Instruments to Host Free Technical Conferences in 27 North American Cities

National Instruments today announced open registration for the 2009 NI Technical Symposium, a series of free, full-day technical conferences that highlight the cutting-edge technology that can help engineers and scientists increase productivity and improve efficiency. Offered in 27 cities in the United States and Canada from October through December, the conferences will deliver technical sessions, hands-on tutorials and new product demonstration...

Test & Measurement
15th September 2009
National Instruments - NI TestStand ATML Toolkit for Automated Test Application Development

National Instruments today announced the NI TestStand ATML Toolkit to help engineers reduce development and maintenance time by expanding test system component interoperability and increasing test system documentation. The Automatic Test Markup Language (ATML) is an IEEE standard consisting of XML document formats that describe different aspects of a test system.

Communications
1st September 2009
National Instruments Announces FPGA Capabilities for Distributed I/O

National Instruments today announced new field-programmable gate array (FPGA) capabilities for the NI 9144 expansion chassis. By downloading the NI-Industrial Communications for EtherCAT 1.1 driver from www.ni.com, engineers and scientists can now run National Instruments LabVIEW FPGA code directly on the NI 9144 chassis to execute custom triggering, inline processing and control within an application. By embedding hardware-level FPGA logic direc...

Design
1st September 2009
National Instruments Introduces High-Performance FlexRay and CAN Interfaces

National Instruments has announced NI-XNET CAN and FlexRay embedded network interfaces, which help engineers working in industries such as automotive and aerospace quickly prototype, simulate and test next-generation FlexRay and controller area network (CAN) devices and networks. The NI-XNET embedded networks platform consists of 14 new high-performance PCI- and PXI-based interfaces for FlexRay and CAN and a new, universal API for rapid applicati...

Analysis
21st August 2009
Registration Opens for NIDays 2009

Engineers, scientists and educators involved in test and measurement, industrial control and automation, and embedded design are invited to attend NIDays 2009, the annual professional development conference, hosted by National Instruments UK & Ireland. This renowned industry event is held in association with the Institution of Engineering and Technology, (IET) and media partners Electronics Manufacture & Test, The Engineer and New Electronics, o...

Design
19th August 2009
National Instruments - Tools for Creating Custom Data Management Applications in LabVIEW

National Instruments has announced the release of the NI LabVIEW DataFinder Toolkit, an extension of the LabVIEW graphical system design platform that helps engineers and scientists search and find valued data faster. Engineers and scientists worldwide have adopted LabVIEW because of the ease of use of graphical programming as well as the performance it delivers.

Test & Measurement
18th August 2009
National Instruments Introduces NI VeriStand 2009 Real-Time Testing and Simulation Software

National Instruments today announced NI VeriStand 2009, an open, configuration-based software environment for creating real-time testing applications such as hardware-in-the-loop (HIL) and controlled environmental tests. All of the common functionalities of a real-time test system are implemented and optimized inside NI VeriStand in a ready-to-use format, making it possible for real-time test system developers to complete their test application d...

Analysis
13th August 2009
National Instruments - NI Recognises Engineering and Science Innovation

National Instruments recognised 20 innovative applications developed by engineers, scientists and researchers from around the world at the second annual Graphical System Design Achievement Awards earlier this month. At the award ceremony held during the annual NIWeek graphical system design conference and exhibition in Austin, Texas, winners from 10 categories ranging from academic/research to prototype/validation test were recognised for develop...

Analysis
11th August 2009
National Instruments and SolidWorks Collaborate on a Virtual Prototyping Solution

National Instruments, a leader in control design and embedded systems, and Dassault Systèmes SolidWorks Corp., a leader in mechanical design software, today announced their collaboration on a pioneer mechatronics tool that helps mechanical and control engineers work together to lower the cost and risk of motion system design. Seamlessly connecting NI LabVIEW graphical system design software and SolidWorks® 3D CAD software, the new virtual proto...

Communications
10th August 2009
NI Simplifies Advanced Motion Control

National Instruments has announced the new LabVIEW NI SoftMotion Module, which simplifies the development of advanced single- and multi-axis motion applications, and new NI C Series modules, which expand the connectivity of the NI CompactRIO programmable automation controller (PAC) platform to hundreds of servo and stepper drives from NI and third-party vendors.

Design
6th August 2009
NI LabVIEW 2009 Targets Emerging Applications With New Technologies

National Instruments has announced LabVIEW 2009, the latest version of the graphical system design software platform for control, test and embedded system development. LabVIEW 2009 simplifies the development challenges of parallel hardware architectures with new virtualization technology that takes advantage of multicore systems as well as by offering new compiler improvements and IP that enhance field-programmable gate array (FPGA) design.

Test & Measurement
6th August 2009
National Instruments Introduces Wireless Sensor Network Platform

National Instruments has announced the NI wireless sensor network (WSN) platform, a complete remote monitoring solution that consists of NI LabVIEW graphical programming software and new reliable, low-power wireless measurement nodes. The adoption of wireless technology for remote monitoring applications is growing, yet engineers and scientists struggle to find an integrated solution that can provide the required measurement quality, power manage...

Test & Measurement
6th August 2009
National Instruments and Tektronix Develop Industry’s Fastest PXI Digitizer

National Instruments has announced the joint development of a high-speed digitizer with Tektronix, a leading provider of test, measurement and monitoring instrumentation. The PXI Express digitizer sets a new milestone for PXI modular instrumentation performance, with greater than 3 GHz bandwidth, sample rates beyond 10 GS/s, data throughput of more than 600 MB/s and multi-module synchronization capabilities. Because of this collaborative developm...

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