National Instruments today announced NI X Series multifunction data acquisition (DAQ) devices for USB. USB X Series devices integrate high-performance analog measurement and control channels, digital I/O and counter/timers onto a single plug-and-play device, which engineers and scientists can use for a wide variety of portable test, measurement and data-logging applications. USB X Series DAQ devices include up to 32 analog inputs, four analog out...

National Instruments today introduced the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test. Its modular PXI archi...

National Instruments today introduced the NI PXIe-5630 6 GHz two-port vector network analyzer (VNA), the automated test industry’s first VNA available in a compact PXI form factor. With support for full vector analysis of transmission and reflection (T/R) parameters, precision automatic calibration and flexible software-defined architecture, the new VNA is ideally suited for automated design validation and production test. Its modular PXI archi...

National Instruments today announced the addition of Windows OS support and Camera Link connectivity for NI Embedded Vision Systems, providing manufacturing engineers and system integrators three new options to develop high-performance machine vision solutions. Two of the new options featuring Windows support, the NI EVS-1463 and EVS-1464 systems, offer 80 GB storage and are suitable for image and data logging.

National Instruments ( announced the new Ethernet-based NI CompactDAQ modular data acquisition system, which combines the ease of use and low cost of a data logger with the performance and flexibility of modular instrumentation. The new NI cDAQ-9188 chassis is designed to hold eight I/O modules for measuring up to 256 channels of electrical, physical, mechanical or acoustic signals in a small (25 by 9 by 9 cm), rugged form factor. With more tha...

National Instruments (Nasdaq: NATI) reported quarterly revenue for Q2 2010 of $212 million, representing a 39 percent year-over-year increase and an 11 percent sequential increase. For the first half of 2010, the company reported a 30 percent increase in revenue and a 15 percent increase in non-GAAP operating expenses, compared to the first half of 2009. GAAP operating expenses grew by 14 percent in the first half of 2010, compared to the first h...

National Instruments announced LabVIEW 2010, the latest version of the graphical programming environment for design, test, measurement and control applications. LabVIEW 2010 delivers time savings with new features such as off-the-shelf compiler technologies that execute code an average of 20 percent faster and a comprehensive marketplace for evaluating and purchasing add-on toolkits for easily integrating custom functionality into the platform...

National Instruments has announced that Dr. Michio Kaku, best-selling author and professor at City College of New York, will deliver the closing keynote address at NIWeek 2010, the world’s largest graphical system design conference and exhibition scheduled for Aug. 3–5 in Austin, Texas.

National Instruments has received four awards from leading industry trade publications for hardware and software, as well as an award recognising the company for excellence in business-to-business marketing. Editors and readers from Test & Measurement World, Design News and Control Engineering selected NI X Series multifunction data acquisition (DAQ) devices for PCI Express and PXI Express, the NI wireless sensor network (WSN) platform and the NI...

Throughout the month of August, National Instruments UK & Ireland invites scientists and engineers to develop their knowledge and expertise by taking part in the Summer of LabVIEW, a series of webcasts about the NI graphical programming language that has revolutionised the development of test, measurement and control applications.

National Instruments has announced new PXI and PCI interfaces that expand the NI-XNET platform to include support for the Local Interconnect Network (LIN) communication bus. The new NI PXI-8516 and NI PCI-8516 LIN interfaces make it possible for engineers and scientists to develop LIN applications in NI LabVIEW, NI LabWindows™/CVI and C/C++ for Windows and LabVIEW Real-Time OSs. As part of the NI-XNET platform, the new PXI and PCI interfaces ar...

National Instruments has announced new interfaces for PROFIBUS, FOUNDATION Fieldbus and DeviceNet that make it possible for engineers to connect LabVIEW, programmable automation controllers (PACs) and embedded systems to their existing industrial networks. The new interfaces provide industrial control engineers the ability to add high-speed measurements and analysis, advanced control, Web connectivity and data logging to existing systems to impr...

National Instruments has announced the release of a new vision module for the PXI platform that provides a high-performance parallel processing architecture for hardware-defined timing, control and image pre-processing. The new NI 1483 Camera Link adapter module, in combination with an NI FlexRIO field-programmable gate array (FPGA) board, offers a solution for embedding vision and control algorithms directly on FPGAs. Engineers and scientists c...

When staging battles between the most feared warriors in history, the hit Spike TV show, “Deadliest Warrior,” uses National Instruments software and hardware to help determine the winner. The show, whose engineers have conducted demonstrations at NIWeek, selected NI LabVIEW graphical system design software, the NI CompactDAQ data acquisition platform and NI DIAdem data management software to conduct impact tests and measure and analyse the bi...

National Instruments today announced the availability of more than 100 C Series plug-in modules from National Instruments and third-party companies. With more than 50 modules from NI, 50 third-party modules and a multitude of chassis available, there are numerous configuration options to address a wide variety of measurement and embedded control needs. Engineers and scientists can insert NI C Series modules into any of the C Series family of chas...

National Instruments introduced its new solution for IEEE 802.11n wireless LAN (WLAN) testing, the NI WLAN Measurement Suite 2.0, which includes enhanced software toolkits for IEEE 802.11n WLAN signal generation and analysis. The suite integrates with NI 6.6 GHz PXI Express multichannel RF signal generators and analysers to deliver true, phase-coherent multiple-input, multiple-output (MIMO) RF measurements required for IEEE 802.11n WLAN testing....

National Instruments announced the company’s first data acquisition (DAQ) modules with integrated signal conditioning for scalable, high-performance measurements on PXI Express. The new NI SC Express family delivers increased accuracy, high data throughput and best-in-class synchronisation for measuring strain gauges, bridge-based transducers, thermocouples and high-voltage analogue inputs. PXI Express provides 250 MB/s of dedicated bandwidth f...

National Instruments UK has achieved prestigious Laureate status in the UK’s Best Workplaces Programme, after being named one of the UK’s 50 Best Workplaces for a fifth consecutive year. NI is now among only 20 companies in the UK, from hundreds that have been recognised by the Great Place to Work® Institute, to have achieved the accolade of Laureate status.

National Instruments (Nasdaq: NATI) has announced the NI PXIe-8133 high-performance embedded controller, which features the quad-core Intel® Core™ i7-820QM processor. The new controller is the first PXI Express quad-core controller in the industry. By combining the latest technology from Intel and advancements in the PCI Express bus, the new controller helps engineers greatly reduce test time with double the processing performance and data thr...

National Instruments today announced the availability of its 2010 Automated Test Outlook report, which shares findings of the company’s research into innovations and technologies shaping today’s test and measurement applications. The business and technology insights presented in the outlook apply across many industries including communications, aerospace and defense, semiconductor, automotive and consumer electronics. The goal of the 2010 Aut...