Multitest announces that its Quad Tech concept is the next generation of vertical contact technology. Its superior test yield and long probe life results in significant cost of test advantages. Quad Tech uses a barrel-less architecture with four continuously engaged internal contact points.

Multitest,will exhibit its test solutions at the upcoming Silicon Valley Test Conference, scheduled to take place November 10-11, 2011 at the Biltmore Hotel in Santa Clara, Calif. At the conference, Multitest will showcase the most comprehensive portfolio of contactors on the market.

Multitest announces that the Santa Clara board fab has refined its pulse plating process to integrate it into Multitest’s fabrication process to further enhance the high aspect ratio capability. The integration is a result of the Santa Clara board fab anticipating the market trend for chip scale packages, particularly for fine-pitch array packages such as BGAs or LGAs.

Multitest announces that its well-established MT9928 XM Gravity Test Handler recently outperformed two major competitors during an extensive evaluation at a key player in semiconductor production. The benchmark process took more than one year and included an offline evaluation phase as well as a real production test.

Multitest, will exhibit its leading test solutions in Booth #1.342 at the upcoming SEMICON Europa, scheduled to take place October 11-13, 2011 at the Messe Dresden in Germany. The MT2168’s speed and high parallelism fully leverage improved tester capabilities with shorter index times and multi-site testing.

Multitest contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that the MT2168 fully leverages today’s tester capabilities in terms of shorter test times and higher parallelism, e.g. 16 sites. However, there are many applications in the market where the number of simultaneously tested devices is lower than 16. The MT2168 is the best choice for these applications as well bec...

Multitest, announces that its MT9928 tri-temp test handler was chosen for a novel MEMS oscillator application that requires the most accurate temperature calibration. Multitest is well known for test equipment with highly accurate and stable temperature control. Therefore, the MT9928 xm was the test handler of choice for this MEMS application.

Multitest has shipped the first InPhone system to a European site of a major IDM. Combined with the Multitest InStrip handler, the InPhone system is dedicated to high parallel MEMS test and the calibration of MEMS microphones. The InStrip has been configured for InCarrier test. Thus, singulated MEMS packages can be tested with the high parallelism of the InStrip handler.

Multitest has expanded its post assembly, flying probe test capacity to meet the growing demands of PCB assembly. As ATE assemblies become more complex, the probability of costly delays increases.

Multitest has expanded its post-assembly, flying probe test capacity to meet the growing demands of PCB assembly. As ATE assemblies become more complex, the probability of costly delays increases.

Multitest will showcase its leading test solutions in Booth #313 at the upcoming International Test Conference (ITC), scheduled to take place September 18-23, 2011 at the Disneyland Hotel in Anaheim, Calif.

Multitest announces that its MT2168 has proven its superior placement concept at a high-volume production site in Asia. The customer experienced a significant improvement in the placement rate of tested devices in the output tray.

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, is pleased to announce that its Mercury™ contactor, recognized for its excellent electrical and mechanical performance, was able to prove its leading features in a head-to-head evaluation against another established contactor of an incumbent Asian competitor.

Multitest’s Burn-in Product Group has received a multiple repeat order for burn-in boards from a large European IDM for automotive devices.

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, introduces MT9510 x16, a new 16-site tri-temp pick-and-place handler.

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, has successfully added a new application to its MEMS test and calibration product line. With the new application, 3-D earth magnetic field sensors can be used for innovative mobile applications and state-of-the-art navigation applications without the use of a GPS.

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that Reinhart Richter has been promoted to President of the Multitest Group effective immediately.

Multiest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its Dura Kelvin contactors again have proven their reputation for outstanding lifetime and cleaning cycles. At an international IDM’s high-volume production site, the Dura Kelvin contactor substantially contributed to reducing the overall cost of test.

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its installed base of WLCSP contactors is steadily growing. The contactors are running high-volume production at subcontractors in China, Taiwan, Singapore and other locations. They show outstanding lifetime performance, contributing to unreached cost of te...

Multitest, a designer and manufacturer of final test handlers, contactors and load boards used by integrated device manufacturers (IDMs) and final test subcontractors worldwide, announces that its MT2168 is designed for best tester utilization. Short index time (DUT exchange time), fast loading and sorting, and a high soak capacity support the handler to keep pace with the new tester generation.