Learn about conducting AC input analysis for current harmonics for testing power supplies using the Keysight InfiniiVision X Series oscilloscopes.

See how to conduct AC input analysis for inrush current for your power supply testing with the Keysight InfiniiVision X-Series oscilloscopes.

Keysight Technologies’ E5080A ENA vector network analyser (VNA) offers a combination of RF measurement performance and speed, enabling a claimed tenfold improvement in test time. The new VNA uses the Keysight PNA- and PXI-Series software architecture, making it easier for engineers to take measurements across multiple Keysight VNAs.

Keysight Technologies has introduced a new ball grid array (BGA) interposer solution for testing DDR4 x16 DRAM designs with a logic analyser. The interposer solution provides fast, accurate capture of address, command and data signals for debugging designs and making validation measurements.

Keysight Technologies will fly into Mobile World Congress in Barcelona (March 2-6) with its newest wireless design and test solutions that address present and future wireless design and test challenges. The company will showcase innovations in LTE-A, including 3GPP, Releases 11, 12 and 13 and also will demonstrate leading edge 5G wireless test and simulation solutions.

See how the Keysight S-Series oscilloscopes, from 500MHz to 8GHz, compare to the LeCroy HDO scopes in a variety of common measurements.

Keysight Technologies will demonstrate the latest features of the E7515A UXN wireless test set at Mobile World Congress in Barcelona (March 2-5).  The demonstration will feature 1) cutting-edge LTE-Advanced functionality, 2) 3G test capabilities that allow wireless engineers to assess, characterise and stress user equipment (UE) designs, and 3) full end-to-end IP data throughput of 450 Mbps using three component carriers in realistic channel...

Keysight Technologies has signed a memorandum of understanding with Tomsk State University of Control Systems and Radioelectronics (TUSUR). The goal of the partnership is to organise the Centre of Competence that will develop teaching and research programs to advance students’ understanding of RF and microwave technologies.

Keysight Technologies’ latest field-emission scanning electron microscope (FE-SEM), the 8500B, offers scientists the analytical power of energy dispersive spectroscopy (EDS), fully integrated within a compact, low-voltage FE-SEM. The plug-and-play FE-SEM has been designed for use in practically any lab and requires only an AC power outlet. The image resolution rivals that of much larger and more expensive FE-SEMs.

This short video will demonstrate making a power quality measurement on your power supply, using Keysight InfiniiVision X-Series oscilloscopes.

Keysight Technologies has two cable test options for its FieldFox handheld analysers. Cables (e.g., waveguide, coaxial and twisted-pair) are the most widely used components in RF and microwave communication systems. They are also the leading cause of their failure. During maintenance of these systems, engineers and technicians need to measure cable performance (e.g., return loss and voltage standing wave ratio (VSWR)), while also identifying faul...

Keysight Technologies has combined the attributes of an oscilloscope into its IntegraVision power analyser. It means R&D engineers designing and testing electronic power conversion systems can now use one instrument to access dynamic views of current, voltage and power. Neither will they have to use a power analyser to make an accurate measurement and then turn to an oscilloscope to visualise repetitive and single-shot events such as turn-on ...

Learn about Keysight's unmatched power integrity solution, the N7020A power rail probe.

Keysight Technologies has introduced N1930B Physical Layer Test System (PLTS) 2015, the latest release of its signal integrity test software for designing and validating high-speed digital interconnect. A key software enhancement in PLTS 2015 includes an N-port automatic fixture removal (AFR). This enhancement removes the effects of multiple test fixtures with a single step – reducing the error-correction time by 75% diwhen compared to...

Fast and accurate characterisation of PAM-4 signals can now be made using Keysight Technologies’ 86100D DCA-X wide-bandwidth oscilloscope platform. The 86100D-9FP PAM-N analysis software provides comprehensive analysis of optical and electrical PAM-4 (pulse amplitude modulation with four amplitude levels) signals.

Keysight Technologies has collaborated with YellowSys to produce an option that enables the U5303A high-speed data acquisition, 12-bit PCIe card to address optical coherence tomography (OCT) technology. The data acquisition solution uses signal resampling which provides on-board enhancement of the range analysis and offers a stable ADC signal sampling cadence.

Keysight Technologies has introduced adjustable and integrated intersymbol interference (ISI) capability for the J-BERT M8020A high-performance BERT. When engineers characterise and test high-speed digital receivers for compliance, they often need to emulate a certain channel loss. The new adjustable and programmable ISI function allows engineers to emulate channel loss.

Keysight Technologies has expanded the capabilities of its E7515A UXM wireless test set. The new features address the rapidly evolving 3GPP LTE-Advanced carrier aggregation advancements. The UXM wireless test set is a highly integrated signalling test set created for functional and RF design validation in the 4G era and beyond.

Keysight Technologies has released the latest version of its GoldenGate software, a simulation, analysis and verification solution for large-scale RFIC circuit design. Keysight EEsof EDA’s GoldenGate 2015.1 offers new and enhanced capabilities designed to improve productivity and efficiency for silicon RFIC designers.

Keysight's InfiniiVision 3000T X-series oscilloscopes are optimised with advanced integrated capabilities such as serial decode applications, 6-in-1 instrument integration, time/frequency domain correlation, and more, to help you solve your toughest measurement challenges.