The IEEE has named Dr. Reza Zoughi as the recipient of the 2011 IEEE Joseph F. Keithley Award in Instrumentation and Measurement. Zoughi is being recognized for his contributions to microwave and millimeter wave measurement techniques for nondestructive testing and evaluation. The award, sponsored by Keithley Instruments, Inc. (NYSE:KEI), is presented for outstanding contributions in the field of electrical measurement. It consists of a bronze me...

Keithley Instruments will broadcast a free, web-based seminar titled “Overcoming the Electrical Measurement Challenges of High Brightness LEDs” on Thursday, October 28, 2010 at 15:00 Central European Summer Time (CEST).

Keithley Instruments extends its congratulations to Drs. Andre Geim and Konstantin Novoselov, scientists at the University of Manchester in England who were just awarded the 2010 Nobel Prize in Physics for their research on graphene, a single-atom-thick form of carbon with outstanding physical, electrical, and chemical properties. In their research, Geim and Novoselov employed several Keithley Instruments products, including the Model 2400 Source...

Danaher Corporation and Keithley Instruments, Inc. announced today that they have entered into a definitive merger agreement pursuant to which Danaher will acquire all of the outstanding Common Shares and Class B Common Shares of Keithley at a purchase price of $21.60 per share in cash for an enterprise value of approximately $300 million net of cash to be assumed. The acquisition has been unanimously approved by the Keithley Board of Directors.

Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced a new release of its ACS Basic Edition Semiconductor Parametric Test Software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices. It features a Trace Mode tha...

Keithley Instruments has announced that its Metrology Services department has achieved renewal of its ISO 17025 accreditation, having successfully completed a rigorous three-and-a-half-day ISO 17025 re-accreditation assessment by A2LA (American Association for Laboratory Accreditation). As part of the A2LA assessment, Keithley has also been successfully accredited to the new ANSI/NCSL Z540.3-2006 American standard. The scope of Keithley’s accre...

Keithley Instruments introduced the six-slot Model 707B and single-slot Model 708B switch matrix mainframes, which are optimized for semiconductor test applications in both lab and production environments. By providing significantly higher command-to-connect speeds, these switch mainframes make faster test sequences and greater overall system throughput possible. Equally important, these new mainframes support Keithley’s Model 7174A “Air Matr...

Keithley Instruments Model 2400 Series

This webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley's new pulse measure unit.

Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, announced results for its fiscal 2010 third quarter ended June 30, 2010.

Keithley Instruments, Inc. announced its new Nanotechnology Technical Test Library on CD. The content of this free CD is helping to advance electrical measurements by providing technical papers, articles, data sheets, and links to online seminars covering a wide range of nanotechnology test applications. These applications include measurements that reveal important parameters of nanoscale semiconductor devices and materials, carbon nanotubes, Hal...

This web-based seminar describes the basics of low current measurement. This is the second installment of the Low Level Measurements Seminar Series. By participating in the seminar, you'll learn: - How to use product specifications to pick the right current measurement instrument - Practical ways to reduce current noise in measurement set-ups - Most importantly, how to quantify subtle sources of noise

Keithley Instruments will broadcast a free, web-based seminar titled “Understanding the Basics of Electrical Measurements” on Thursday, July 8, 2010. To register for this event, visit http://www.keithley.info/basics10.

Keithley Instruments has introduced the Model KUSB-488B USB-to-GPIB Interface Adapter. The Model KUSB-488B, which complements Keithley’s precision measurement instruments, is priced at $495 USD, which is less than competitive versions, helping test engineers and researchers lower their cost of test, measurement, and ownership. To minimize the cost associated with switching to a new adapter, the Model KUSB-488B’s driver library is fully comman...

Keithley Instruments will broadcast a free, web-based seminar titled “Understanding the Basics of Electrical Measurements” on Thursday, July 8, 2010. To register for this event, visit http://www.keithley.info/basics10.

The most widely measured physical parameter is temperature. Whether in process industry applications or in laboratory settings, accurate temperature measurements are a critical part of success. Accurate temperature measurements are needed in medical applications, materials research in labs, electrical/electronic component studies, biology research, geological studies, and electrical product device thermal characterization.

Keithley Instruments introduced the Model 3732 Quad 4x28 Ultra-High Density Reed Relay Matrix Card. The card, which offers 448 single-pole matrix crosspoints, was designed for automated switch and measure applications that require multiple instrument connections as well as high crosspoint density and high speed. It is an ideal solution for use in a wide range of high pin count research and development and production tests applications, such as lo...

Keithley Instruments will broadcast a free, web-based seminar titled “New Methods for Testing FLASH Memory” on Thursday, May 20, 2010. This one-hour presentation will examine new developments, such as multi-level cell (MLC), that are aimed at achieving increased density. The seminar will also explore the continuous advancements that are being made in measurement techniques and capabilities from characterizing a single transistor for developm...

Keithley Instruments, Inc. (NYSE:KEI), a world leader in advanced electrical test instruments and systems, has released a tutorial CD that offers practical and helpful techniques for obtaining the most accurate and precise measurements possible. Keithley's A Guide to Understanding Electrical Test and Measurement CD is the most in-depth knowledge center that Keithley has ever created, and covers all aspects of measurement performance, including ho...