Hprobe announces new generation of magnetic test head for wafer sort of MRAM in mass production

Hprobe has announced the first industry turnkey testing equipment dedicated to 3D magnetic sensors used in both automotive and industrial applications. The equipment is based on Hprobe’ s unique 3D magnetic field generator technology for single and multi-site testing at wafer-level, under magnetic field.

Provider of turnkey semiconductor Automatic Test Equipment (ATE) for magnetic devices, Hprobe will present at the MRAM Developer Day 2019, a new technology of magnetic generator for ultra-fast testing time (less than one second) of Magnetic Tunnel Junction (MTJ) for Spin Transfer Torque (STT) MRAM devices under perpendicular magnetic field at above 2 Tesla.