GOEPEL electronic
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GOEPEL electronic Articles
G-TAP – versatile Contacting Solution for Assembly Test
The G-TAP is not a single product but an overall concept, because the module can be utilized in stand-alone operations as well as an integrated solution in existing electronic and optical test systems such as Flying Probers, In-Circuit Test or AOI systems.
ChipVORX Prototype Instruments for Bit Error Rate Tests
At the International Test Conference, GOEPEL electronic introduces the first ChipVORX model prototype to execute Bit Error Rate Tests using on-board Field Programmable Gate Arrays. The new solution enables the utilisation of FPGA Embedded Instruments in the form of special softcores for the test and design validation of high-speed I/O.
GOEPEL announce availability of Xilinx Zynq-7000 All Programmable SoC component special model libraries
GOEPEL electronic announces the availability of special model libraries for Xilinx Zynq-7000 All Programmable SoC components to support all programming and test strategies based on the innovative Embedded System Access technologies.
GOEPEL electronics demonstrates Embedded System Access Technologies at ITC
At this year’s International Test Conference (ITC) in Anaheim, CA, taking place November 4th to November 9th, GOEPEL electronics LLC will present its strategic realignment in regards to testing, programming, validation, and functional verification at chip, board, and system level, under the umbrella of Embedded System Access (ESA).
Technologically leading Test and Measurement Solutions at electronica 2012
At this year’s electronica trade show in Munich/Germany GOEPEL will introduce awarded as well as worldwide unrivalled and new solutions in electric and optical test and measurement technologies. In hall A1, stand 351 interested parties are welcome to learn about the versatile opportunities to support various test methods such as JTAG/Boundary Scan, Automated Optical Inspection (AOI), Automated X-Ray Inspection (AXI) and solder paste inspection ...
Goepel's VarioTAP Emulation Test extended to Fujitsu Graphical Display Controllers
GOEPEL electronic announces the availability of special model libraries for the first Fujitsu Graphical Display Controllers of the MB86R0x Jade series and MB86R1x Emerald series to support the innovative emulation technology VarioTAP. The libraries, described as VarioTAP models, enable the flexible execution of processor emulation tests utilizing the native debug interface. On this basis, hardware verification and test, as well as Flash memory pr...
GOEPEL's Boundary Scan Controller with Wireless LAN Interface
GOEPEL electronic has today revealed the launch of the SFX/WSL1149-(x), the world’s first controllers for Wireless LAN as an addition to the company’s Boundary Scan hardware platform SCANFLEX. The new Boundary Scan controller series provides a Triple Stream/Dual Band WLAN interface for theoretical transmission speed up to 450 Mbps, enabling wireless utilisation of the newest Embedded System Access technologies for testing, programming and deb...
GOEPEL combines Boundary Scan with NI's FlexRIO
GOEPEL electronic has announced development of a Boundary Scan option for National Instruments‘ PXI/PXIe FlexRIO cards. The solution enables the utilization of the FPGA based FlexRIO hardware as Boundary scan I/O module. That provides users a wide range of supplementing test strategies for a significant increase in structural test depth for prototypes or in the production process.
GOEPEL develops new version of the ScanVision tool suite for Boundary Scan design visualization
In cooperation with the company ASTER Technologies, GOEPEL electronic developed a new version of the ScanVision tool suite for Boundary Scan design visualization. The further development solves the problem of multi board design visualization at the layout and schematic level, enabling a significantly improved level of productivity in project development as well as fault analysis on the production stage.
Utilisation of chip embedded instruments made easy with GOEPEL's Automatic Application Program Generator
GOEPEL have announced the development of an Automatic Application Program Generator for the utilisation of Chip embedded Instruments based on the ChipVORX technology. The new generator is another option within the integrated JTAG/Boundary Scan software platform SYSTEM CASCON.
GOEPEL electronics strengthens Sales Forces in the UK and Ireland
Meeting the challenges of the demanding UK market, GOEPEL electronics Ltd. has added three new sales specialists for the company’s product ranges of JTAG/Boundary Scan equipment as well as Automated Optical Inspection, Automated X-ray Inspection and Solder Paste Inspection systems.
ChipVORX Model Libraries for the New Generation of Arria V GX FPGA Devices
GOEPEL electronic announces the availability of the first ChipVORX model libraries for the new generation of Arria V GX FPGA devices from Altera supporting embedded test and embedded programming. ChipVORX provides users the opportunity to implement a so called Embedded System Access, completely omitting nail or probe contacting.
Interference-free Boundary Scan Applications
GOEPEL electronic introduces the TAP-Isolator, a special module to improve interference immunity in serial scan operations. The newly developed hardware was specifically designed for applications in critical signal environments needing potential isolation, enabling a complete galvanic insulation of the Test Access Port transceiver from the target.
GOEPEL Develop API for SCANFLEX Hardware Platform
In cooperation with selected partners of the GATE alliance program, GOEPEL has developed a comprehensive Application Programming Interface for the company’s hardware platform SCANFLEX. The API provides third-parties direct access to, and control of, the entire SCANFLEX hardware down to bit level from their respective software systems. Hence, users will be able to define synchronized interactions with other processes and modules as well as contr...
Product Range with Boundary Scan I/O Module for 30 V
GOEPEL electronic introduces the SFX5212, another I/O module within the frame of the company’s Boundary Scan hardware platform SCANFLEX.
GOEPEL and Cypress Collaborate to provide new Programming Tools for PSoC3 Devices
In close cooperation with Cypress, GOEPEL electronic has developed a dedicated VarioTAP model library for the PSoC3 programmable System on Chip series. VarioTAP is a universal processor centric emulation technology for programming, test and design validation.
New Solution for CAN Interface Multiplexing - the Hub4x from GOEPEL
GOEPEL electronic have launched the new hardware module Hub4x, an efficient solution for multiplexing CAN interfaces. Hub4X enables simultaneous information exchange with several units under test (UUTs), which historically resulted in considerable communication problems, due to message clashes or received messages not being traceable to the originating UUTs.
Extended Integration of GOEPEL electronic’s Boundary Scan into Rohde & Schwarz TSVP Platform
The enhanced OEM cooperation between Rohde & Schwarz and GOEPEL electronic enables additional options for customer-optimized utilisation of the R&S TSVP. Applying the extended combination of functional/in-circuit test and Boundary Scan, users are now able to achieve an even higher test depth and test speed.
GOEPEL electronics extends VarioTAP Emulation Test to Freescale QorIQ Communication Processors
GOEPEL electronics announces the availability of dedicated model libraries for first Freescale QorIQ processors of the series 10xx, 20xx and 30xx to support the innovative emulation technology VarioTAP. The libraries, described as VarioTAP models, are structured modularly as intelligent IP, enabling a complete fusion of Boundary Scan test and JTAG emulation.
GOEPEL electronics combines Boundary Scan with JTAG Platform Cable USB II from Xilinx
In cooperation with the company Xilinx, GOEPEL electronics has developed a new software option to support Platform Cable USB II. The new solution completely integrates the Xilinx hardware into the IEEE 1149.x development environment SYSTEM CASCON, enabling the utilization of Platform Cable USB II as native controller to execute Boundary Scan tests throughout the entire product life cycle.