GOEPEL electronic, world class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, launched a new series of JTAG Digital I/O PXI modules named PXI 5396-x.

GOEPEL electronic, leading manufacturer of JTAG / Boundary Scan solutions compliant with IEEE1149.x, announced the launch of a new interface test fixture, CION Fixture™ /PCIe-x16, a further addition to the popular CION Fixture™ family. The new low cost fixture provides a predefined PCI Express x16 Slot, in which the card to be tested is inserted and thereby connected to a TAP (Test Access Port). Due to the integrated test channels IEEE 1149.1...

GOEPEL electronic, a JTAG/Boundary Scan vendor, has introduced an in-system emulation technology of the next generation named VarioTAP. The solution is based on a flexibly configurable streaming technology of the TAP signals based on respective µProcessor model libraries (VarioTAP Models). This means, VarioTAP enables a complete fusion of JTAG emulation and Boundary Scan test for real interlaced test operations and multivalent Flash in-system pr...

GOEPEL electronic, a vendor of JTAG/Boundary Scan solutions compliant with Std. IEEE1149.1, has launched an additional component for its Boundary Scan hardware platform SCANFLEX called SFX-TAP7.

GÖPEL electronic has introduced the ScanBooster Designer Studio, a new family of low cost test systems. Based on a powerful JTAG/Boundary Scan Controller with Plug and Play USB2.0 interface, combined with a special edition of the integrated development environment CASCON GALAXY, this new offering is especially suited for the rapid verification of prototypes.

GOEPEL electronic announces the market introduction of CION Module™/DIMM168 as another I/O module of the CION product family. The new digital low cost module is serially controlled via TAP by special CION™ ASIC chips, and enables the testing of all signal and voltage supply pins of JEDEC Std. compliant DIMM168 plug connectors.

GOEPEL electronic a world-class vendor of JTAG/Boundary Scan solutions compliant with IEEE Std. 1149.x, introduced the ScanBooster/USB-FXT as an additional high-performance but low cost controller. The new controller is based on a USB2.0 interface and complements the already existing ScanBooster™ product range by externally coupled test heads. This gives a solution for problems of critical TAP accesses to ATE fixtures and HASS/HALT application...