Corelis, a specialist in JTAG Boundary-Scan technology and embedded hardware test solutions, is thrilled to announce its participation in two premier industry events.

Provider of JTAG and boundary-scan test systems and tools, Corelis, will introduce the NetUSB II at IEEE AUTOTESTCON 2018, September 17th to 20th alongside new technologies, innovative applications, products, and services for the military and aerospace test industry and government and military customers. 

Corelis will exhibit its latest ScanExpress JTAG/Boundary-scan test software suite at the Aerospace Electrical Systems Expo, co-located with the Space Tech Expo in Pasadena, California (May 24-26). Attendees will have the opportunity to discover first-hand the latest developments and innovations in the field of JTAG testing. The newest ScanExpress product family version 8.3 showcases an improved project management environment, broader e.MMC progr...

Version 8.3 of its ScanExpress Boundary-Scan Tool Suite has been released by Corelis. The new software update features an enhanced user interface for ScanExpress Viewer, test and programming support for e.MMC components in 4-bit configurations, and improved scripting support, plus numerous improvements spanning the complete suite of ScanExpress software applications.

The latest ScanExpress JTAG/Boundary-scan test software suite from Corelis will be highlighted at IPC APEX EXPO 2016 in Las Vegas (March 15-17). Exhibition attendees can gain insight from the California-based company into the most recent developments and innovations in the field of JTAG testing.

Version 8.2 of its ScanExpress Boundary-Scan Tool Suite has been released by Corelis. This new version adds powerful trace imaging using ODB++ netlist data to the ScanExpress Viewer circuit board diagnostic display system. Also included are test and programming support for e.MMC components, a memory model search interface, new CPU family support, plus numerous improvements spanning the complete suite of ScanExpress applications.  

The Corelis ScanExpress software for JTAG/boundary-scan test support is now integrated into Teradyne Di-Series high-performance digital test instruments (DTI). Di-Series instruments are VXI-compliant and widely used in existing and new Automatic Test Equipment (ATE) installations.

Engineers looking for a quick and easy start on JTAG test and debug can now use a starter kit launched by Corelis. The JTAG Starter Kit is a new value-oriented bundle that combines the advanced capabilities of ScanExpress Debugger with a portable USB 2.0 JTAG controller and includes 12 full months of support and software updates.

Corelis, Inc announced the introduction of the JTAG Interrogator, a simple software tool designed to assist in the validation of authentic semiconductors. Targeted at receiving inspection and quality assurance departments, the JTAG Interrogator utilizes IEEE-1149.1 standard on-chip electronic identification techniques to aid in the detection and reporting of counterfeit semiconductors.

Corelis announce Version 1.24 of its I2C Exerciser software, enhancing the triggering capability of Corelis’ powerful BusPro-I and CAS-1000-I2C/E bus analyzer products. The new advanced trigger offers easy-to-use, graphical trigger sequence design interface, pre-defined trigger templates for common scenarios, and two independent external trigger signals for integration with external equipment.

Corelis announced today the availability of version 7.8 of its ScanExpress Boundary-Scan Tool Suite. This new version includes numerous new features and enhancements including improved cluster testing support, intelligent BSDL file handling, and a new model-based test coverage.

Corelis has released a new version of its I2C Exerciser software, Version 1.23. The software improves the capabilities of Corelis’ powerful BusPro-I and CAS-1000-I2C/E bus analyzer products. Major enhancements and features incorporated in this release include:

Corelis, Inc. announced today that its free Runner-Lite test executive is now compatible with Freescale USB TAP probes. This added support allows existing Freescale hardware users to execute pre-generated JTAG-based test procedures on select Freescale reference designs.

Corelis announced ScanExpress JET support for Texas Instruments Sitara ARM Cortex-A8 and ARM9 microprocessors, specifically the AM37x, DM37x, and AM18x families. ScanExpress JTAG Embedded Test (JET) is a cutting edge test methodology providing at-speed testing of embedded processor-based electronic printed circuit boards and systems to detect, isolate, and diagnose structural and functional defects while minimizing test development time and resou...

Corelis has announced the ScanExpress JET support for all members of the Freescale i.MX51 family of applications processors. ScanExpress JTAG Embedded Test (JET) provides at-speed testing of embedded processor-based electronic printed circuit boards and systems to detect, isolate, and diagnose structural and functional defects with minimal development and investment.

Corelis, Inc., announced today ScanExpress JET support for AMD embedded processors. Supported AMD processor families include Turion™ II Neo, Athlon™ II Neo, Opteron™ 4100, and Opteron™ Quad-Core (socket Fr5). These processors represent high performance, low power processing for edge-of-enterprise markets including storage and telecommunications, as well as more traditional embedded markets such as security and medical imaging, military sy...

Corelis announced the USB-1149.1/CFM, a JTAG hardware platform that seamlessly integrates advanced boundary-scan test patterns into Teradyne in-circuit testers. The USB-1149.1/CFM is designed specifically for use with Teradyne TestStation and GR228x series testers. By utilizing the USB-1149.1/CFM with Corelis’ ScanExpress family of JTAG software products, Teradyne users gain the benefit of:

Corelis, Inc., has announced the availability of the latest version of its powerful ScanExpress Boundary-Scan Tool Suite. The new Version 7.6 CD is the first test tool to include JTAG embedded test support for AMD Family 10 processors, enabling processor emulation-based testing capabilities on AMD ASB2, Opteron 4100, and Quad-Core Opteron CPUs.

Corelis, Inc. announced it will celebrate 20 years of operation at the International Test Conference this September 20th in Anaheim, CA. Since its founding in 1991, Corelis has delivered a diverse range of electronic test equipment solutions for customers across a wide range of industries, including aerospace, defense, medical, manufacturing, networking and telecommunications. Today, Corelis continues that trend with focus on product ease of use ...

Corelis, Inc. today announced support for National Instruments High Speed Digital I/O (HSDIO) instruments with Corelis’ ScanExpress suite of high-performance JTAG test and measurement tools. The marriage of National Instruments hardware with Corelis software provides a seamless path for deploying boundary-scan test and programming capabilities on existing PCI, PXI, and PXIe test platforms.