A wide range of test solutions for diverse applications throughout the Internet of Things (IoT)will be featured by Advantest at this year’s SEMICON Japan (December 14-16) in Tokyo. Advantest will showcase both its newest test solutions and its market-proven products. Displays will be organised into four general categories of IoT applications: Industrial, Wireless/Wearables, Connected Homes, and Connected Automobiles.

A pick-and-place handler has been developed by Advantest to improve productivity in testing system-on-chip (SoC) devices in high-volume manufacturing (HVM) and device characterisation pre-production environments. This helps users to keep pace with the rapidly changing SoC market and quickly adapt to changes in device technology.

Semiconductor test equipment supplier Advantest will highlight the latest measurement solutions for automotive, communications and consumer devices at electronica in Munich (November 8-11). Show attendees can learn more about Advantest’s EVA100 measurement system for low-pin-count analogue, mixed-signal IC and sensor devices.

The T2000 AiR, a compact, air-cooled system optimised for low-cost testing in R&D and high-mix, low-volume production is available to order from Advantest. Shipments to customers are expected to begin in the first quarter of calendar year 2017. Global market demand continues to grow for smartphones and other mobile electronic devices as well as consumer and enterprise services offered over the internet.

A full line of test solutions for automotive, communications and consumer devices together with metrology and advanced E-beam lithography systems will be exhibited by Advantest at SEMICON Europa in Grenoble (October 25-27). Visitors will see the latest product developments for the V93000 platform.

The F7000 EB (electron beam) lithography system will be the centerepice of Advantest’s stand at the Micro and Nano Engineering Show in Vienna (September 19-23). The system delivers high throughput and creates very accurate and smooth nano-patterns on wafers from 1X-nm resolutions.

 The MPT3000HVM system has been developed by Advantest to provide a single platform to test the full range of SATA, SAS, and PCIe solid-state drives (SSDs), from the highest performance enterprise to the most cost-effective client SSDs. The system achieves this optimal production test solution by leveraging the proven MPT3000 tester-per-DUT (device under test) architecture and unique hardware acceleration in a new high-density configuration.

Complete solution for measuring the dimensions of nanoscale patterns introduced by Advantest and Digital Surf. They have announced that PM3D Map software based on Digital Surf’s industry-standard Mountains Technology is now incorporated into the company’s leading-edge Multi Vision Metrology Scanning Electron Microscope (MVM-SEM) series. Advantest’s MVM-SEM system together with PM3D Map software now provide a complete soluti...

The HA1000 die-level handler is a cost-efficient test solution for determining known good dies (KGD) prior to IC packaging announced by Advantest. Economics is a driving factor in die-level testing. Determining a semiconductor device’s viability prior to packaging or building memory stacks is critical to avoiding rework, achieving high yields and lowering costs.

Dual sessions in the United States and Asia will be key features of Advantest’s 10th annual VOICE Developer Conference. Key players in the semiconductor test industry will get opportunities to hear more than 120 technical presentations, talk with experts at technology kiosks, visit the Partners’ Expo, attend networking events and conduct in-depth discussions relating to Advantest’s broad range of IC test solutions.

VOICE, the annual developer conference hosted by leading semiconductor test equipment supplier Advantest will celebrate its 10th anniversary in May with a comprehensive line-up of more than 120 technical presentations, technology kiosks, a Partners’ Expo, multiple networking events and opportunities for in-depth discussions about Advantest’s test platforms as well as handlers, test cell solutions and related technologies.

The new T5830 memory tester is the latest member of Advantest’s T5800 product family, optimised for testing a wide range of flash memory devices used in mobile electronic devices.  As portable applications are booming, the global market for flash-memory test systems is projected to reach $148 million by 2018, according to market analysis firm VLSIresearch.

Test solutions for measuring the connected world – and everything in it – will be demonstrated by Advantest at the SEMICON China trade show in Shanghai (March 15-17). In addition to exhibiting, Advantest is sponsoring two events at the show - the Build China IC Manufacturing Ecosystem Forum and the China Semiconductor Technology International Conference (CSTIC).

The DC Scale AVI64 module from Advantech is designed to give the V93000 single scalable platform the broadest application coverage on the market. Using Advantest’s innovative universal analog pin architecture, the 64-channel module extends the V93000 platform’s capabilities to include testing of power and analog ICs that enable smart, internet-connected electronics for the rapidly growing mobile, automotive and Internet of Things (IoT...

The new HA7200 temperature and pressure stimulus unit, designed to apply the precise temperature and pressure required for final testing of pressure sensors has been unveiled by Advantest. Up to four sensors can be tested in a small chamber with the temperature controlled by the dual-fluid technology used on Advantest’s test handlers.

Advantest will have a prominent presence at the SEMICON Japan trade show (December 16-18) at the Tokyo Big Sight international exhibition centre. In addition to showcasing a wide spectrum of automatic test equipment (ATE) and presenting a technical paper, Advantest is a gold sponsor of this year’s event, which includes sponsoring the President’s Reception on December 16.

The T5851 system is designed to provide a cost-effective test solution for high-performance universal flash storage (UFS) devices and PCIe BGA solid-state drives (SSDs) – memory ICs in high demand by makers of low-power, mobile applications such as smart phones, tablets and ultra-portable laptops.

The latest model of its EVA100 measurement system, the high-throughput EVA100 Production Model designed for volume production of sensors, low-pin-count analogue ICs and mixed-signal ICs has been introduced by Advantest. Fully compatible with the initial EVA100 system introduced last year, the new Production Model allows users to establish a standardised measurement environment from design evaluation through production, dramatically improving thei...

A new TDR Option for Advantest’s TS9000 series of terahertz analysis systems has been released. It enables analysis of circuit quality in semiconductors, printed substrates, electronic components, and other applications, utilising short-pulse terahertz waves.

An international call for papers on semiconductor test solutions, best practices and innovative technologies has been issued for next year’s tenth annual VOICE Developer Conference, organised by Advantest. Based on the success of holding VOICE sessions in China and the U.S. last year, the 2016 conference will again be held on both sides of the Pacific Ocean – in San Diego, California on May 10-11 and in Hsinchu, Taiwan on May 18 &ndas...