Semiconductor test equipment supplier Advantest Corporation has announced that it will feature its wide range of solutions for advanced IC testing and wafer metrology at SEMICON Korea on January 23rd to 25th at COEX in Seoul, South Korea. Among the products that Advantest will feature in booth #C510 in Hall C are systems and enhancements that the company has recently announced.

Registration has opened for Advantest's VOICE 2019 Developer Conference, along with the announcement of the full keynote speaker line up for the US program. The conference will be held in two new locations – Scottsdale, Arizona on May 14-15 and Singapore on May 23 – under the unifying theme “Measure the Connected World and Everything in It”.

A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems led by Tetsuo Endoh has successfully demonstrated operation of a high-writing-speed spin-transfer torque magnetic random access memory (STT-MRAM) using an Advantest memory test system.

A tool that measures fine pattern dimensions on photomasks with higher precision and stability has been launched by Advantest. The E 3650 MASK MVM-SEM (Multi Vision Metrology Scanning Electron Microscope) uses the company’s proprietary technology.

The T5851 STM16G memory tester from Advantest is for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

A module for its EVA100 measurement system that enables testing of high-power ICs used in large-volume consumer applications has been introduced by Advantest. With the new HVI (high-voltage VI source and measurement) module, chip makers can ensure the reliability of power devices in widely used applications such as AC/DC and DC/DC converters, motor controllers, LED drivers and gate drivers by accurately measuring their current leakage and breakdo...

Measurement tools and solutions for automotive, communications and consumer devices will be showcased by Advantest at electronica in Munich, Germany (13-16 November). Visitors will be able to attend demonstrations of the on-demand CloudTesting Service, and see the latest capabilities of its EVA100 analogue/mixed-signal IC Test solution and theV93000 A-Class SoC test system for device engineering and production, as well as its HA7300 stimulus...

A collaboration between Advantest and Tohoku University’s Center for Innovative Integrated Electronic Systems (pictured), led by Tetsuo Endoh has successfully developed a high-speed, high-precision module that can measure the switching currents in the memory arrays of spin-transfer torque magnetic random access memory (STT-MRAM) in units of microamperes and nanoseconds, using an Advantest memory test system.

Test Systems Strategies (TSSI), and Advantest CloudTesting Service (CTS), have announced a new software module to convert electronic design automation (EDA) formats (e.g., VCD, EVCD, WGL, STIL) to the Advantest CTS CX1000 platform.

Leading semiconductor test equipment supplier Advantest has released its V93000 SMU8 parametric tester to meet chip makers’ process-characterisation and monitoring needs for the exacting measurements required on the 28nm to 3nm process nodes and beyond.

Two additional members of its next-generation B6700 family of burn-in memory testers have been announced by Advantest. The B6700L and B6700S models are designed to lower the cost of test while boosting the parallel testing capacity for NAND flash memories now in high demandfor server and mobile data-storage applications.

Hardware, software and online test solutions will be showcased by Advantest at the 2018 International Test Conference (ITC) in Phoenix (October 28-November 2). Demonstrations of its on-demand CloudTesting Service, the latest capabilities of its EVA100 analogue/mixed-signal IC test solution, a novel facial-recognition tool that combines cloud and real-time edge-computing artificial intelligence (AI) and a new tool for power profiling devices under...

A next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile data-storage solutions during the memory market’s current super cycle has been unveiled by Advantest. By measuring the functions of NAND flash and DRAM memory devices during burn-in, this new tester delivers both high throughput and a low cost of test.

Advantest has opened the call for papers for the international VOICE 2019 Developer Conference, focusing on innovative test solutions and best practices using the V93000 and T2000 system-on-chip (SoC) test platforms as well as Advantest memory testers and handler solutions.

  Semiconductor test equipment supplier, Advantest Corporation, has installed its 3,000th V93000 Smart Scale test system for use by its long-term customer AMD, in evaluating AMD Ryzen, AMD Radeon and AMD EPYC compute, graphics and data centre products.

Leading semiconductor test equipment supplier Advantest will feature its F7000 EB (electron beam) lithography system and other nanotechnology-ready equipment at the Micro and Nanoengineering (MNE) show in Copenhagen (September 25-27). The MNE program and exhibition covers current and relevant activities in micro- and nanoengineering.

The VOICE 2018 Developer Conference staged by Advantest has set new records with 177 submitted abstracts representing contributions from 13 countries. In addition to more than 90 technical presentations, VOICE 2018 featured informative Partners’ Expos, highly rated keynote speakers, 25 interactive technology kiosks and multiple networking opportunities.

A fully integrated test solution for developing, debugging and mass producing PCIe Gen 4 solid-state drives (SSD) has been launched by Advantest on the MPT3000 platform. This is the same tester used by manufacturers of PCIe Gen 3, SATA and SAS SSDs. The all-inclusive test solution enables SSD manufacturers to accelerate their newest products’ time to market.

Leading semiconductor test equipment supplier Advantest will be active on the exhibit floor, in the technical program and in the classroom at SEMICON West 2018 in San Francisco (July 10-12). Advantest will showcase its new FVI16 floating power VI source, which gives the V93000 single scalable platform the industry’s best VI signal performance.

The E3640Multi Vision Metrology Scanning Electron Microscope (MVM-SEM) will be showcased by Advantest at the upcoming European Mask and Lithography Conference in Grenoble (June 18-20). This advanced tool supports pattern measurement for photomasks and other patterned media at dimensions as small as 1Xnm.