Advantest has announced its new T2000 Enhanced Device Power Supply 150A (DPS150AE) module that enables its T2000 test platform to handle the load requirements for highly accurate testing of both high-current and low-voltage semiconductors, including microprocessor units (MPUs), application-specific ICs (ASICs) and field-programmable gate arrays (FPGAs).

Advantest has unveiled the first member of its NEO-SSD family of products for testing advanced solid-state drives (SSDs). The MPT3000 system enables accelerated SSD product development and faster time-to-manufacturing ramp. The system improves users’ engineering efficiency through powerful, easy to use software tools and a multi-protocol hardware architecture.

A 1.6 GBit per second digital module from Advantest incorporates a new feature called Functional Test Abstraction Plus (FTA+) to achieve protocol-aware testing in which the tester communicates directly with the devices under test (DUT) in each IC’s protocol language. Advantest says that the T2000 digital module will improve efficiency in testing system-on-chip (SoC) devices on the T2000 test platform.

An evolutionary value-added platform that combines digital and analogue testing capabilities to handle small-pin-count analogue, mixed-signal and sensor semiconductors has been unveiled by Advantest.  The EVA100’s expandable architecture provides the flexibility to conduct a wide range of measurement functions.

Advantest’s terahertz power meter, the TAS5500 is a basic measurement instrument that computes the strength of terahertz waves by detecting the heat generated when these waves are absorbed by matter. This enables input power to be measured to ±8% accuracy.The measurement accuracy is based on the Japanese national standard for infrared power measurement, recalibrated for the terahertz region with measurement data accumulated by Advant...

Advantest has extended its V93000 capabilities with the DPS128HV module, a high-density device power supply (DPS) unit designed to handle a wide range of operating voltages for testing devices such as eFlash memory ICs. With the new module, Advantest’s V93000 test platform can be easily scaled from low-channel to high-channel configurations to provide the most economical test solution for each specific device under test.

VOICE, the annual developer conference hosted by Advantest, will continue its tradition of offering a dynamic technical program in 2014 with a record number of papers presented in two locations – May 12-13 in Silicon Valley, California at the Hyatt Regency Santa Clara, and May 15-16 in Austin, Texas at the Radisson Hotel & Suites Austin Downtown.

Advantest has introduced two new test modules for high-speed, cost-efficient testing of radio-frequency (RF) ICs used in cell phones and wireless LAN devices built to meet 802.11ac and LTE-Advanced mobile communication standards. Both the 32-port WLS32-A module and the 16-port WLS16-A module are fully compatible with Advantest’s T2000 platform.

Advantest’s latest digital channel card is the Pin Scale Serial Link (PSSL) for at-speed characterisation and volume production of high-speed semiconductors. PSSL is capable of data rates up to 16 Gbps. It extends the speed and performance capabilities of Advantest’s previous Pin Scale cards to enable affordable, at-speed testing of high-end ICs.

Advantest now has a test solution for next-generation memory ICs that enable high-demand mobile applications and servers. With its highly parallel testing capabilities and full compatibility as an upgrade on Advantest’s widely used T5503 test platform, the new T5503HS offers high productivity and low cost of test within an upgradable design.

Advantest’s T2000 ISS IPE2 image-processing test module has been developed to apply greater image-processing capabilities to test today’s CMOS image sensors at higher throughput and lower cost. Advanced CMOS image sensors (CIS) are used extensively in today’s smart phones, tablet computers, digital cameras, video camcorders and other high-volume electronic products.

Advantest Corporation présente son nouveau handler pour les dispositifs SoC (System On Chip), le système pick-and-place  évolutif M4871. L'appareillage intègre la technologie éprouvée d'Advantest appliquée sur les autres lignes de produits existant dans l'entreprise, avec de nouvelles fonctions avancées, incluant l'alignement visuel à haut débit, le contrôle thermiqu...

Advantest have unveiled the field-upgradable M4871 pick-and-place system. The company's latest test handler for system-on-chip devices, it integrates Advantest’s proven technology from existing product lines with advanced, new functionality including visual alignment with high throughput, and active thermal control using Advantest’s Tri-Temp capability.

A revolutionary pay-per-use solution combines semiconductor test with cloud computing technology, offering semiconductor companies access to test capabilities while minimising investment and effort. Stephane Cavazzini, Advantest’s Sales Account Manager for SOC IDM, explores further in this ES Design magazine article.

Advantest Corporation annonce aujourd'hui qu'elle a enregistré ses trois premières commandes pour son nouveau système de lithographie par faisceau d'électrons, le F7000, auprès de l'Université de Tokyo, de l'Université de Kyoto, et d'un client de l'industrie des semi-conducteurs. Les systèmes seront livrés dans l'année fiscale se terminant en mars 2014. 

Advantest Europe GmbH annonce aujourd'hui qu'il sera le partenaire européen du Service CloudTesting. Au travers de ce partenariat, Advantest offre un accès à des capacités de test aux entreprises de semi-conducteurs tout en minimisant leur investissement et leur engagement. Ce service est idéal pour les ingénieurs de vérification de conception, les fabless et les institutions éducatives disp...

Advantest Corporation a annoncé que Shanghai Huahong Integrated Circuit Co., Ltd est le premier fabricant de puces électroniques à utiliser le testeur générique V93000 Smart Scale d'Advantest dans sa configuration low-cost Dragon pour le test hautement parallèle des semi-conducteurs RFID. L'architecture Universal Pin du testeur, disponible sur tous les systèmes Smart Scale, élimine le besoin...

Advantest has entered the market for testing system-on-chip (SoC) mobile power-management ICs (PMIC) using the V93000 platform. Compatible with Advantest’s base of V93000 systems, the new solution can perform multi-site testing of complex SoC devices and single in-line packages (SiP) with embedded power-management cores.

Advantest Corporation and Galaxy Semiconductor Solutions have entered a joint development and distribution agreement for Advantest’s new Test Floor Intelligence software solutions. Advantest and Galaxy will cooperate to deliver advanced test-floor management systems that monitor and optimize test processes for both systems- and device-related issues, helping customers improve their overall equipment effectiveness. Advantest’s TFI software sol...

Advantest Corporation has introduced its newest Test Floor Intelligence software solution, TFI 2.0, designed to improve the overall equipment effectiveness of production test operations by efficiently mining and analyzing the large volume of data generated during semiconductor testing.