A full line of test solutions for automotive, communications and consumer devices will be shown by Advantest together with its metrology and advanced E-beam lithography systems at SEMICON Europa Dresden (October 6-8). Visitors will be able to learn more about the V93000 platform’s capabilities in improving time to quality (TTQ) in multi-site radio-frequency (RF) applications and testing IoT devices.

EB (electron beam) lithography and MVM-SEM (Multi-Vision Metrology Scanning Electron Microscope) solutions will be showcased by Advantest at the 41st Micro and Nano Engineering Show in The Hague (Sept 21-24). Highlighted products include theF7000 EB lithography system for direct writing of nano-patterns on wafers, the E3310 and E3640 MVM-SEM systems for wafer and mask metrology and the E5610 DR (defect review)-SEM for inspecting next-generation p...

DA-Integrated has installed a V93000 Smart Scale SoC test system from Advantest. DA-Integrated’s selection of the V93000 Smart Scale system is based on the tester’s high performance and scalability, its widespread use at outsourced semiconductor assembly and test foundries and its compatibility with the previous P1000 test system, legacy equipment from Advantest’s 2011 acquisition of ATE supplier Verigy.

Advantest has introduced the fastest fully integrated memory test card in history, the HSM16G. The card extends the high-speed testing capabilities of the company’s V93000 HSM series of testers to native 16Gb/s for at-speed testing of ultra-fast memory ICs. Advantest's ATE solution supports device engineering, debugging and volume production of today’s highest speed GDDR5 and future GDDR5X ICs, with parallel data busses up to 16Gb/s.

Advantest has entered a strategic partnership with Universal Scientific Industrial (Shanghai) (USI), a member of the ASE Group of companies, to offer the first dedicated outsourced assembly and test (OSAT) services to the growing market for solid-state drives (SSDs). This collaboration allows SSD manufacturers to test their designs and devices on the advanced MPT3000 test platform while minimising up-front capital investment by outsourcing test a...

The Intel Developers Forum will see Advantest showcase its test solutions for emerging market segments including the Internet of Things (IoT) and wearable electronics. The new T5833 and proven T5831 memory testers, which are built on Advantest’s modular AS Platform will be centre stage at the Forum (August 18-20) in San Francisco.

Advantest has announced firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G SSDs, making this tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs. The addition of SAS and SATA to the proven support for PCIe 3.0, NVMe and AHCI extends the platform’s test coverage to include SSDs that use any of today’s major protocol standards.

Downloadable firmware that enables all MPT3000 systems to test Serial Attached SCSI (SAS) 12G and Serial ATA (SATA) 6G solid-state drives (SSDs) has been released by Advantest. The company says that it makes the tester the first true single-system solution for testing SAS, SATA and PCIe protocol SSDs.

A full range of test solutions designed to enable the Internet of Things (IoT) including automatic test equipment (ATE), terahertz measurement systems, multi-vision scanning-electron microscopes (SEM) and an e-beam lithography system will be demonstrated by Advantest at SEMICON West 2015 in San Francisco (July 14-16).

The VOICE 2015 Developer Conference organised by Advantest became a truly international forum last month by holding the event in both Santa Clara, California and Shanghai, China – the first time that this annual gathering of test equipment users, suppliers and partners has been held outside the United States.

The new T5833 system from Advantest is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Shipments to customers are beginning this month. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater d...

A technology that utilises short-pulse terahertz waves for analysis of electrical circuits has been developed by Advantest. The technology has 2 major applications – analysis of the transmission characteristics (S parameters) of devices using the sub-terahertz band (100GHz~1THz), and characterisation and location of failures in chip circuits (TDT/TDR).

Advantest’s annual VOICE Developer Conference kicks off on May 12 in Silicon Valley, California and May 22 in Shanghai, China. VOICE will include technical presentations, a partners’ expo, and interactive discussion sessions for users of the V93000 and T2000 SoC test platforms, as well as Advantest handlers and test cell solutions, offering extensive learning and networking opportunities for all attendees.

Advantest will showcase its broad product portfolio, including its semiconductor test solutions, nanotechnology products and terahertz systems at SEMICON China (March 17-19) The show will be held at the Shanghai New International Expo Centre.

Advantest will showcase its CloudTesting solutions from its group company, Cloud Testing Service at DATE 2015 at the ALPEXPO-ALPES Congress in Grenoble (March 9-13).  Backed by Advantest’s 60-year history of measurement technology and innovation, CTS solutions offer the latest high-quality test methods utilising IPs, characterization tools, analysis and more.

Advantest has combined improved positioning accuracy higher throughput and tighter temperature control in its new M6245 test handler. The system incorporates the company’s latest advances for handling double data rate (DDR) and Flash memory devices. The test handler incorporates a visual-alignment system that improves test yields by achieving contact accuracy to within 0.3 mm ball pitch.

Advantest has launched a new multi-purpose parametric measurement unit (PMU) module, the T2000 PMU32E, to enhance its T2000 platform’s capabilities in testing digital, analogue and power-management system-on-chip (SoC) devices. The new high-density, 32-channel module is fully compatible with Advantest’s original PMU32 module – even using the same tester interface unit (TIU) – while offering twice the resolution and accurac...

There are three key trends in testing the next generation of display driver ICs that control high resolution LCD panels, and Advantest has launched its new T6391 system to meet these requirements. The new tester will address the growing number of pins on display driver devices, the increasing speeds of interfaces and highly integrated multi-functions – all of which contribute to higher resolution displays.

Advantest is preparing to exhibit its broad portfolio, including its nanotechnology products, terahertz systems and semiconductor test solutions at SEMICON Europa in Grenoble (October 7-9).  It will highlight its multi-vision CD-SEM metrology solutions and newest e-beam lithography tool.

Advantest has extended the capabilities of its V93000 test platform for high-voltage and high-current testing of embedded power devices. It has launched the PVI8 floating power source, which gives the V93000 sufficient power and enough analogue and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs.