Keysight enhances boundary scan analyser with support for IEEE standards

The release – the x1149 Boundary Scan Analyser Tester 2.0 – offers the latest boundary scan architecture for on-chip debugging and analysis tools to identify and resolve defects in complex integrated circuits (IC) that contain multiple intellectual properties and dies. 

Using the IEEE 1149.1-2013 standard, the x1149 Boundary Scan Analyzer offers the ability to track the serial numbers of each integrated circuit (IC) for component traceability and counterfeit protection using the Electronic Chip Identification (ECID) feature. In addition, x1146 allows designers to ensure optimal operation of their ICs by allowing them to test the performance, reliability, and functionality of mission-critical ICs under actual operating conditions via the Built-In Self Test. 

"ICs compliant with the new IEEE 1149.1-2013 standards have started shipping," said Adrian Cheong, Product Management Manager of Keysight's Electronic Industrial Solution Group. "With the x1149, manufacturers can now test PCBs assembled with these ICs. By using boundary scan test methods, the test points connected to these ICs can be removed, saving real estate on today's smaller PCBs yet maintaining the test coverage and consequently ensuring the quality of the resulting products."

When using the new version of the x1149 with support for IEEE 1149.1-2013, design engineers can expect around a 75% increase in test coverage with the following test capabilities:

• Register mnemonic
• IC reset control
• Component initialization mechanism
• Segmented boundary scan register
• Power domain support
• Test mode persistence
• Electronic Chip Identification (ECID)
• Procedural Description Language (PDL)