X-ray inspection system speeds real-time imaging

28th November 2016

Altus Group

Mick Elliott

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The product portfolio for the UK and Ireland at Altus Group has been strengthened by the addition of X-ray and CT inspection equipment developed and manufactured by Nikon Metrology. One such solution available from Altus is Nikon Metrology’s XT V 160, a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications.

Equipped with an in-house designed X-ray NanoFocus source and high precision manipulator, this industry-leading inspection system offers unrivalled feature recognition compared to any product available on the market today.

As such, the XT V 160 NF is a valuable addition to any electronics development and production environment.

Richard Booth, Altus managing director said: “There has been growing interest in X-ray and CT inspection equipment as the need for more powerful measurement techniques increases to analyse ever more densely populated circuit boards. We believe that systems like those from Nikon Metrology will become more and more popular as the need to undertake inspection in a non-destructive manner is ever more important as the popularity of microelectronics increases.

“Nikon Metrology’s range of equipment is a welcome addition to our extensive product portfolio and we look forward to a long and successful relationship with them.”