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“The increased use of extended Boundary Scan techniques has led to the customers’ need for a completely integrated production system. That is fully satisfied by our innovative JULIET™ testers,” says Ralph Dressler, Director of GOEPEL electronics Asia Ltd. “Due to the use of the preset JULIET™ tester, time-consuming integrations for cost-intensive special solutions can be saved, and the handling becomes all in all more effective. At the same time, with this system we become the first vendor to provide off-the-shelf products for turn-key solutions.”

In principle, all JULIET™ systems allow the execution of Boundary Scan tests, In-System-Programming (ISP) of Flash and PLD, functional emulation tests, MCU programming, and interface tests, with the active process being visualised on an integrated display. The control of the complete process is carried out by an externally USB or LAN connected PC or laptop, using more control elements integrated in the system.

Another revolutionary solution is GOEPEL electronic the in-system emulation technology of the next generation named VarioTAP®. The solution is based on a flexibly configurable streaming technology of the TAP signals based on respective µProcessor model libraries (VarioTAP Models). This means, VarioTAP™ enables a complete fusion of JTAG emulation and Boundary Scan test for real interlaced test operations and multivalent Flash in-system programming for the very first time.

The result is a hitherto unrivalled flexibility, modularity and performance supporting in-system applications for distributed multi TAP/ multi processor structures. The synergy of our industrially proven technologies SCANFLEX® and VarioCORE® significantly improves the test and programming strategies as well as the quality of fault coverage and fault diagnostic for boards with highly reduced test access.

VarioTAP™ in principle supports all JTAG/IEEE1149.1 compliant µProcessor or µController, independent of the scan chain configuration up to multi processor or multi core applications. The µProcessor can be of different types or even implemented in the local path of a scan router. The adaptive streaming technology offers the opportunity to execute emulation tests in a test program parallel or interactively to Boundary Scan tests. Thereby, the number of Boundary Scan ICs and scan cells as well as TAPs is practically unlimited. By utilising the hardware platform SCANFLEX®, for instance up to eight TAP can be controlled independently and simultaneously to other I/O resources.