Geotest to Showcase PXI Semiconductor Test System –TS-900 at productronica 2011

The TS-900 base system offers comparable system features and capabilities found in proprietary ATE systems. Available as a benchtop (Figure 1) or cart-based model (Figure 2), the TS-900 takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution. In addition, the test system incorporates a custom-designed performance test interface that supports the use of PCB Device Under Test (DUT) boards — a proven and high-performance method for interfacing to the device under test. Additionally, the receiver interface's pin blocks are field configurable, allowing users to upgrade the receiver when they modify or upgrade the configuration of the PXI system. The configuration of the receiver can support up to 512 digital channels, as well as a range of analog, power supply and RF resources.

The base system includes the following features and capabilities:
20-slot, high-power PXI chassis with integral receiver interface

Embedded Core 2 Duo controller
(64) 100 MHz digital channels with per pin PMU (expandable to 512)

64 static digital channels (expandable to 128), which can be used for fixture ID, UUT static control or DUT board relay control

0 — 40 volt user power supply (expandable to 4 channels)

System self-test fixture and test program, which provides functional verification of the system
ATEasy test executive and programming environment

DIOEasy digital waveform editing and display tool

The basic system offers lots of room for expansion — 14 additional PXI slots are available for adding more digital or analog test resources as needed. In addition, Geotest offers software tools for converting STIL and WGL test vectors to Geotest's digital vector format.

The TS-900 combines some of the key features associated with proprietary ATE systems with the benefits of the PXI modular architecture. The result is a test system that provides outstanding value and features for test engineers looking for cost-effective solutions to support design verification, failure analysis, pilot runs or focused production test.