Analysis
SEICA to show complete COMPACT line of in-circuit and functional testers at Electronica 2012
Once again, Seica has great news this year for visitors at Electronica. In fact, for the first time the complete COMPACT line of in-circuit and functional testers, including 6 different models, will be on show.
LikeIn addition, visitors will be able to view a wide range of application solutions on the different systems, including test fixtures and programs implemented in VIVA software and NI Labview/TestStand*, which is 100% compatible with the COMPACT systems’ hardware architecture. This is a unique opportunity for a closer look and a hands-on experience of Seica’s capabilities of specializing ATE according to the client needs and requirements, while maintaining the compatibility of fixtures and programs across the entire system range, which is in full compliance to the lean production guidelines typical of the WCM standard, widely used in different sectors of today’s global industrial production environments.
Pilot V8 Flying Probe System
In addition to the COMPACT line, Seica will be showing the Pilot V8 flying prober, the ultimate in flying probe technology, equipped with 8 mobile probes on both sides, able to deploy 12 different test techniques, ranging from ICT to functional test, boundary scan, optical inspection and thermal scan of components, offering a complete platform for production testing, repair and reverse engineering of electronic boards. Its vertical architecture is the only one which enables true simultaneous, “double side” testing, reliably and accurately, and makes the Pilot V8 the only flying prober capable of doubling test throughput with respect to standard systems, testing 2 identical UUTs simultaneously with a single test program. The “automated” version of the Pilot V8 can operate in full operator-free mode, thanks to the loading/downloading module which is capable of handling up to 600 different board types.