Free Keithley Web-Based Seminar Explores Source Measurement Instrumentation

SMU instruments were originally developed in the 1980s to boost test productivity, deliver more complete characterization, and increase overall test system performance. However, to obtain the optimum productivity, system builders must look beyond the “banner specs” in order to choose the most appropriate SMU for a specific application.

This seminar is recommended for engineers, researchers, educators, and students working with semiconductor-based devices, components, materials, and technologies with current vs. voltage (I -V) characteristics that must be verified and/or better understood. Typical devices and technologies include traditional silicon, compound semiconductors (such as silicon carbide and gallium nitride) for power/energy applications like HBLEDs and solar cells, electronic components, nanotechnology, and new materials like graphene, a single-atomic-layer-thick crystal of carbon that can exist at room temperature.

Lishan Weng, the seminar presenter, is an applications engineer at Keithley Instruments, Inc. in Cleveland, Ohio, which is part of the Tektronix test and measurement portfolio. Weng is interested in new measurement instruments/techniques related to graphene. She holds master’s degrees in both electrical engineering and physics from Purdue University, where her research focused on graphene devices and p-type GaAs/AlGaAs heterostructures. Her previous research also includes carbon nanotube based nanolithography and tunable graphene oxidation, as well as quantum transport measurement and a specialization in AFM lithography.