Fairchild Semiconductor Technologist to Present Techniques for Minimizing System Power Losses at the 2006 Maple Conference

In synchronous buck converters, a MOSFET’s gate resistance (Rg) has significant influence on system losses and loss mechanisms. Using mathematical treatment and laboratory examinations, Elbanhawy’s conference paper will examine the effect of Rg on current distribution on the die and current rise and fall times, which influence the dynamic losses, and also the effect of Rg on shoot through in the synchronous buck converter.

Elbanhawy is director, Computing and Telecommunication Segments, Advanced Power Systems Center at Fairchild Semiconductor. With more than thirty-five years of experience in power supply design and R&D management, he holds seven patents and has applications pending for an additional seven. Elbanhawy has delivered numerous technical presentations at conferences, including PESC, PEDS, Intel Technology Symposium, PCIM, PPDC, IPEC, IPEMC, IIC and Power Systems World, and has written articles for many U.S. and international technical publications.