Agilent Technologies to Demonstrate Leading-Edge RF/Microwave Design and Test Solutions at International Microwave Symposium

The demonstrations will cover everything from circuit-level modeling though system verification for general RF, microwave, 4G communications and aerospace/defense. Highlights include:

Design software: Agilent EEsof EDA solutions address the critical RFIC design challenges. Solutions include ADS 2013 for Multi-Technology and Electro-Thermal; EMPro with multiple 3-D EM simulation technologies tightly integrated with the ADS design platform; and SystemVue 2013, which features design personalities for satellite comms/GNSS, radar, 4G/MSR, DPD, and FPGA hardware-in-the-loop.

Network analysis: Agilent test solutions provide a single connection for multiple measurements of HDMI and WiGiG components. Driven by the PNA-X network analyzer, this millimeter wave solution can fully characterize a transmitter/receiver system with a single connection to the device under test.

Agilent’s PNA-X network analyzers enable users to easily perform noise figure measurements up to 50 GHz with industry-leading accuracy.

Agilent’s 8507xE.07 series software makes it easy to measure electromagnetic material properties. The new user interface adds more traces, multiple charts, advanced trace math and marker functions to help analyze data in intuitive ways that were not possible before.

The FieldFox handheld analyzer’s remote control capability and new Remote Viewer iOS application enable users to make precise RF and microwave measurements from an iPad or iPhone. Also new are a spectrum analysis time-gating option and support for Agilent’s USB peak-power sensors, which are specifically geared toward engineers testing the pulse characteristics of their radar systems.

Signal generation and analysis: Users can generate multi-emitter signal environments using SystemVue design software, a wideband arb, and PSG vector signal generator. They can see, capture and analyze repetitive or intermittent signals using the PXA signal analyzer with real-time spectrum analysis and 89600 VSA software. And they can analyze wideband signals using the Infiniium 90000 Q-Series real-time oscilloscopes and VSA software.

Users can generate and analyze complex millimeter-wave signals up to 1THz with the PSG vector signal generator, PXA signal analyzer and extender modules from solution partner VDI. Agilent’s midrange 32- to 44-GHz EXA signal analyzer supports smart mixers to 110 GHz.

Additional measurement solutions include LTE one-button measurements for manufacturing and design validation, multi-standard radio for base station testing, LTE/LTE-Advanced inter-band and intra-band carrier aggregation support, 8-channel MIMO and WLAN 802.11ac chipset design validation .

With Signal Studio for Global Navigation Satellite Systems, users can perform real-time simulations of the Chinese Beidou navigation satellite signals, with up to 40 channels available for line-of-sight and multipath signals for any combination of Beidou and GPS or GLONASS (L1 with C/A code), and 16 additional channels available for Galileo signals.

Peak power analyzer: Multi-pulse analysis and easy power added efficiency measurements can all be done with one instrument, the Agilent 8990B peak power analyzer.

AXIe digitizers: The multichannel AXIe digitizer module, M9703A is an eight-channel, phase-coherent, 12-bit digitizer with optional, real-time, flexible digital down-conversion. It is capable of measuring wireless, communications, radar, satellite and electronic warfare signals up to 1-GHz wide. It also has an option capable of capturing MIMO signals of interest for baseband IC development.

Agilent business partners’ solutions will include modeling and device characterization, semiconductor foundries, wafer, IC and circuit board measurements and prototyping, antenna measurement systems and test chambers. In addition, Agilent will present several technical programs and workshops.

Dr. Gordon Strachan, the lead architect for the hardware control software in Agilent’s X-Series signal analyzers, will present his keynote address, “Modern RF Measurements and How They Drive Spectrum Analyzer Digital IF Processor Design,” on Wednesday, June 5, at 11:10 a.m. in the MicroApps Pavilion.