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Few members of Agilent's technical staff achieve the level of Agilent Research Fellow. Considerations for selection include:



* a recognized and sought-after international expert;

* leadership in next-generation technology that significantly impacts Agilent and its customers;

* an exemplary record of enduring industry achievement; and

* a role model, consultant and mentor.



The promotion required multiple levels of management review; internal and external letters of recommendation; and final approval by Agilent's Electronic Measurement Group President Ron Nersesian and Agilent's Chief Technology Officer Darlene Solomon.



Dr. Root's leadership was instrumental in the development, commercialization and customer-proliferation of the entire suite of Agilent's X-parameter and nonlinear vector network analyzer technology, said Ron. As an Agilent fellow, David joins an elite group of only six other scientists and engineers in the company.



Dr. Root's 25-year career in the company has been the source of a steady stream of innovation. His accomplishments are characteristically interdisciplinary and often leverage the capabilities of disparate Agilent organizations to bring differentiating solutions to our customers that change the way the industry works. He is widely recognized across industry and academia as a leading expert in modeling and measurement science. An IEEE Fellow since 2002, he served as IEEE Distinguished Lecturer from 2006 to 2008, and won the 2007 IEEE ARFTG (Automatic RF Techniques Group) Technology Award. Dr. Root has authored or coauthored more than 100 scientific journal articles, conference and workshop papers, and books and book chapters. He also has been issued multiple patents. Dr. Root holds a bachelor's degree in physics, a bachelor's degree in mathematics and a doctorate in physics, all earned at Massachusetts Institute of Technology.