Agilent Technologies' Digital Measurement Forum Focuses on Trends Influencing Future of Industry

ADMF 2009 will focus on key issues and trends influencing the future of digital design and testing. The best practices of digital solutions will be presented with a series of demonstration booths dedicated to each solution.



Agilent is committed to providing the digital engineering community with high-quality test solutions that enable customers' success, said Siegfried Gross, vice president and general manager of Agilent's Digital Test Division. The yearly ADMF is just another proof-point of this commitment.



Content at ADMF 2009 will focus on:



* de-embedding and equalization technologies for the test of HDMI , USB 3.0, PCI-E, DisplayPort and more;

* triggering and debugging technologies;

* DDRI/II/III Memory testing technology and solutions; and,

* probing technologies and solutions.



Digital design continues to evolve at a rapid pace and it's critical that designers are aware of the latest solutions and trends, said Xiaoming Liang, Communications Business Development senior manager, Xilinx Asia Pacific. The ADMF Forum is an ideal venue for gaining the latest information and to keep abreast of this fast-changing industry.



Y.H. Xia, geographic application manager, Greater China, Microchip Technology Trading (Shanghai) Co. Ltd., described the annual forum as an excellent opportunity to exchange ideas and network with our industry colleagues.



After Seoul, the forum will visit Penang, Malaysia; Bangalore, India; Singapore; Taipei and HsinChu, Taiwan; and Beijing and Shanghai, China.