Analysis
Agilent Technologies and Stanford University to Explore New Class of Nanoscale Devices
Agilent Technologies today announced it is collaborating with Stanford University in a research program designed to explore a new class of nanoscale devices using a combinations of the scanning probe microscope (SPM) and atomic layer deposition (ALD). The research will enable the rapid prototyping and characterization of nanoscale devices with breakthroughs in sub 10 nm scale for a wide range of applications.
The This program focuses on the integration of ALD, a thin-film technique capable of sub-nanometer precision in thickness, with the nanometer lateral resolution SPM in a drive to extend the capability of scanning probe techniques to prototyping and device fabrication. Historically, performance of electronic devices has been limited by traditional manufacturing methods, such as optical and electron beam lithography, which are not likely to deliver feature resolution significantly below 20 nm. However, the quantum mechanical effects of electron confinement in devices 10 nm or smaller result in phenomena qualitatively different than those seen in larger devices. Taking advantage of this quantum confinement is predicted to result in a new paradigm for electronic devices.
We chose Stanford University for this grant for the recognized expertise of professor Prinz and team, and the close alignment between the proposed research and the future of Agilent's SPM business, said Jack Wenstrand, Agilent's director of university relations. The work between Agilent and Stanford University is part of Agilent's University Relations Program, which facilitates collaborations with universities around the world. Agilent supports scientific work with universities worldwide through direct grants and collaborative research.